Skip to main content
SpringerLink
Log in

Material Characterization Using Ion Beams

  • Book
  • © 1978

Overview

Editors:
  1. J. P. Thomas

    1. Nuclear Physics Institute, Université Claude Bernard (Lyon I), Villeurbanne, France

    View editor publications

    You can also search for this editor in PubMed   Google Scholar

  2. A. Cachard

    1. Department of Physics of Materials, Université Claude Bernard (Lyon I), Villeurbanne, France

    View editor publications

    You can also search for this editor in PubMed   Google Scholar

Part of the book series: NATO Science Series B: (NSSB, volume 28)

This is a preview of subscription content, log in via an institution to check access.

Access this book

Log in via an institution
eBook USD 39.99
Price excludes VAT (USA)
  • Available as PDF
  • Read on any device
  • Instant download
  • Own it forever
Softcover Book USD 54.99
Price excludes VAT (USA)
  • Compact, lightweight edition
  • Dispatched in 3 to 5 business days
  • Free shipping worldwide - see info

Tax calculation will be finalised at checkout

Other ways to access

Licence this eBook for your library

Institutional subscriptions

Table of contents (16 chapters)

  1. Front Matter

    Pages i-xviii
    Download chapter PDF

  2. Ion Beams: Production and Interaction with Matter

    1. Front Matter

      Pages 1-1
      Download chapter PDF

    2. Energy Loss of Charged Particles

      • W. K. Chu
      Pages 3-34

    3. Some General Considerations of Ion Beam Production and Manipulation

      • J. H. Freeman
      Pages 35-61

  3. Surface Studies: keV Range Ions

    1. Front Matter

      Pages 63-63
      Download chapter PDF

    2. Applications of Low-Energy Ion Scattering

      • H. H. Brongersma, L. C. M. Beirens, G. C. J. van der Ligt
      Pages 65-79

    3. Ion Beam Induced Light Emission: Mechanisms and Analytical Applications

      • W. F. van der Weg
      Pages 81-99

    4. Complementary Analysis Techniques: AES, ESCA

      • J. Tousset
      Pages 101-140

  4. In-Depth Analysis

    1. Front Matter

      Pages 141-141
      Download chapter PDF

    2. Fundamental Aspects of Ion Microanalysis

      • G. Blaise
      Pages 143-238

    3. Ion Induced X-rays: General Description

      • Finn Folkmann
      Pages 239-281

    4. The Evolving Use of Electrons, Protons and Heavy Ions in the Characterisation of Materials

      • J. A. Cairns
      Pages 283-301

    5. Backscattering of Ions with Intermediate Energies

      • H. Verbeek
      Pages 303-332

    6. Backscattering Analysis with MeV 4He Ions

      • J. W. Mayer, M-A. Nicolet, W. K. Chu
      Pages 333-366

    7. Microanalysis by Direct Observation of Nuclear Reactions

      • A. Cachard, J. P. Thomas, E. Ligeon
      Pages 367-402

  5. Solid State Studies Using Channeling Effects

    1. Front Matter

      Pages 403-403
      Download chapter PDF

    2. Channeling: General Description

      • J. A. Davies
      Pages 405-428

    3. Flux Peaking — Lattice Location

      • P. Mazzoldi
      Pages 429-453

    4. Analysis of Defects by Channeling

      • E. Rimini
      Pages 455-481

    5. Application of MeV Ion Channeling to Surface Studies

      • J. A. Davies
      Pages 483-495
Back to top

Keywords

About this book

The extensive use of low-energy accelerators in non-nuclear physics has now reached the stage where these activities are recognized as a natural field of investigation. Many other areas in physics and chemistry have undergone similarly spectacular development: beam foil spectroscopy in atomic physics, studies in atomic collisions, materials implantation, defects creation, nuclear microanalysis, and so on. Now, this most recent activity by itself and in its evident connec­ tion with the others has brought a new impetus to both the funda­ mental and the applied aspects of materials science. A summer school on "Material Characterization Using Ion Beams" has resulted from these developments and the realization that the use of ion beams is not restricted to accelerators but covers a wide energy range in the developing technology. The idea of the ion beam as a common denominator of many act1v1t1es dealing with surface and near-surface characterization was enthu­ siastically received by many scientists and a school on this subject received the positive endorsement of NATO. The Advanced Study Institute on Materials Science has assumed for us the status of an "institution" leading to better contact among the many laboratories engaged in this field. The fourth Institute in this series was held in Aleria, Corsica, between August 22 and September 12, 1976.

Editors and Affiliations

  • Nuclear Physics Institute, Université Claude Bernard (Lyon I), Villeurbanne, France

    J. P. Thomas

  • Department of Physics of Materials, Université Claude Bernard (Lyon I), Villeurbanne, France

    A. Cachard

Bibliographic Information

  • Book Title: Material Characterization Using Ion Beams

  • Editors: J. P. Thomas, A. Cachard

  • Series Title: NATO Science Series B:

  • DOI: https://doi.org/10.1007/978-1-4684-0856-0

  • Publisher: Springer New York, NY

  • eBook Packages: Springer Book Archive

  • Copyright Information: Springer Science+Business Media New York 1978

  • Softcover ISBN: 978-1-4684-0858-4Published: 25 November 2012

  • eBook ISBN: 978-1-4684-0856-0Published: 06 December 2012

  • Series ISSN: 0258-1221

  • Edition Number: 1

  • Number of Pages: XVIII, 517

  • Number of Illustrations: 79 b/w illustrations

  • Topics: Solid State Physics, Spectroscopy and Microscopy

Publish with us

Policies and ethics

Back to top

Search

Navigation